Semiconductor memories : technology, testing. and reliability / Ashok K. Sharma

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Material type: Text

TextLanguage: BI Publication details: IEEE The Institute of Electrical and Electronics Engineers, Inc. / Wiley-Interscience New York / Hoboken, New Jersey 1997Description: xii, 462 pages : illustrations ; 26 cm; xvii, 652 ms; 24 cmISBN:

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List(s) this item appears in: ELECTRIC

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Item type	Current library	Collection	Call number	Status	Date due	Barcode
Book	PERPUSTAKAAN KKBDA KOLEKSI PINJAMAN	WP	621.39732 SHA (Browse shelf(Opens below))	Available		00001651

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Includes index.

Includes bibliographical references.

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